- From: Evan Wallace <ewallace@cme.nist.gov>
- Date: Fri, 30 May 2008 10:29:34 -0400
- To: David Leal <david.leal@caesarsystems.co.uk>
- CC: "Bohms, H.M. (Michel)" <michel.bohms@tno.nl>, public-xg-w3pm@w3.org
David Leal wrote: > Dear All, > > Michel's three top items seem to be a good starting point. (Another minor > procedural point - I would like to suggest using N3 rather than XML for RDF > examples wherever possible.) > > I'm not particularly fond of N3 personally. It is compact and easier to write, but I find it harder to read. > I have some initial thoughts on quantities and units, as follows: Can we try to make the email subject match the topic covered? If we are going to talk about a units model let's say that in the subject line. With respect to your suggested units model: Generally, I agree with a units model based on Systems Of Quantities (such as the ISQ defined in ISO 80000) which define Quantity Dimensions (which is what *I* might have called a PhysicalQuantitySpace) used in a corresponding System Of Units (such as SI). I don't agree with the terms that you use or the way that you are modeling them. Here I am using terminology from VIM (International Vocabulary of Metrology). There are also some short-comings to this kind of system though. It loses information for ratios, doesn't distinguish discrete amounts (counts or "number of entities"), and the dimensions for derived units/quantityTypes (aka Kinds of Quantity) don't uniquely identify the type of the quantity being described. Any OWL model for units and quantities should provide some means to provide or derive this information. The following triple raises a more fundamental question: > :PhysicalQuantitySpace rdfs:subClassOf owl:Class . How is the Product Modeling XG planning on using the Semantic Web languages? The above triple messes with the OWL vocabulary. Do you care if you stay in OWL DL or do you intend your OWL/RDFS model for these things to be merely a schema for data in RDF form? -Evan Evan K. Wallace Manufacturing Systems Integration Division NIST
Received on Friday, 30 May 2008 14:30:29 UTC