- From: Benoit Bezaire <benoit@itedo.com>
- Date: Thu, 21 Sep 2006 15:55:33 -0400
- To: "Cruikshank, David W" <david.w.cruikshank@boeing.com>
- CC: public-webcgm-wg@w3.org, forrest@sdicgm.com, ulrich@ematek.de, <roboro@auto-trol.com>
Itedo: Pattern Size - progressing (partial) Mitre Limit - no change (using default OS mitre limit value) Text on Path - no plans to support before end of CR -- Regards, Benoit mailto:benoit@itedo.com This e-mail and any attachments are confidential and may be protected by legal privilege. If you are not the intended recipient, be aware that any disclosure, copying, distribution or use of this e-mail or any attachment is prohibited. If you have received this e-mail in error, please notify us immediately by returning it to the sender and delete this copy from your system. Thank you for your cooperation. Thursday, September 21, 2006, 12:36:44 PM, Cruikshank, David W wrote: > On 9/14/2006, Lofton requested status from the implementers (Forrest, > Don, Benoit, Ulrich, and Rob) on the status of implementing the at risk > features in the test suite (Pattern Size, Mitre Limit, and Text on > Path). Due: 9/21/06 > The following responses have been received: > Rob: > Pattern Size - No plans to support > Mitre Limit - Pass the test > Text on Path - No plans to support > Forrest: > Pattern Size - unknown > Mitre Limit - Pass the test > Text on Path - Partial, could finish, if needed > (Arc Fill test (ARFIIL01) - fixed and pass) > No other response. > Thx....Dave Cruikshank > Technical Fellow - Graphics/Digital Data Interchange > Boeing Commercial Airplane > 206.544.3560, fax 206.662.3734 > david.w.cruikshank@boeing.com
Received on Thursday, 21 September 2006 19:55:03 UTC